Probe grinding wheel for packaging and testing
- Description
Probe grinding wheel for packaging and testing
- Manual
As IC products improve and demand increases, the design of probe cards and contact probes for packaging and testing applications becomes more and more sophisticated. The probe is a device for conducting continuity checks by contacting the electrodes of electronic parts. It is widely used in the inspection of various electronic parts, including semiconductors, LCD panels, PCB, connectors, capacitors, inductors, batteries, etc. .
Special wheel specifications and bond design to meet the precise shape requirements of the probe tip
The probe is composed of multiple parts and a fine, high-precision tip shape. The quality of the probe is judged by the tip shape of the needle shaft that contacts the inspection object. Once the tip shape is worn, resistance value deviation or misjudgment will occur during inspection, which will affect product quality and yield.
*Wheel size and specification is customized.
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